SN74BCT8374ANT
Nambari ya Bidhaa ya Mtengenezaji:

SN74BCT8374ANT

Product Overview

Mtengenezaji:

Texas Instruments

Nambari ya Kipande:

SN74BCT8374ANT-DG

Maelezo:

IC SCAN TEST DEVICE W/FF 24-DIP
Maelezo ya Kina:
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-PDIP

Hesabu:

Ombi la Quotations Mtandaoni
1648336
Omba Nukuu
Kiasi
Kiasi cha chini 1
num_del num_add
*
*
*
*
(*) ni lazima
Tutakurudishia jibu ndani ya masaa 24
TUMA

SN74BCT8374ANT Maalum ya Kiufundi

Kikundi
Ufunguo, Mifumo Maalum ya Mantiki
Mtengenezaji
Texas Instruments
Ufungashaji
-
Mfululizo
74BCT
Hali ya Bidhaa
Obsolete
Aina ya Mantiki
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Voltage ya Ugavi
4.5V ~ 5.5V
Idadi ya biti
8
Joto la Uendeshaji
0°C ~ 70°C
Aina ya Kuweka
Through Hole
Kifurushi / Kesi
24-DIP (0.300", 7.62mm)
Kifurushi cha Kifaa cha Muuzaji
24-PDIP
Nambari ya Bidhaa ya Msingi
74BCT8374

Karatasi za Takwimu na Nyaraka

Karatasi za data
SN54/74BCT8374A

Taarifa za Ziada

Kifurushi cha Kawaida
60
Majina mengine
2156-SN74BCT8374ANT-TI
TEXTISSN74BCT8374ANT

Uainishaji wa Mazingira na Usafirishaji

Hali ya RoHS
ROHS3 Compliant
Kiwango cha Usikivu wa Moisture (MSL)
1 (Unlimited)
Hali ya REACH
REACH Unaffected
ECCN
EAR99
HTSUS
8542.39.0001

Mifano Mbadala

NAMBARI YA SEHEMU
SN74BCT374N
MTENGENEZAJI
Texas Instruments
KIASI KILICHOPATIKANA
0
Nambari ya Sehemu
SN74BCT374N-DG
BEI YA KILA KITU
4.14
AINA YA KUBADILISHA
MFR Recommended
Digi Cheti
certification_01
certification_02
certification_03
certification_04
cr
certification_015
certification_08
esd
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